Abstract
Abstract
Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented.
Funder
Natural Science Foundation of Shaanxi Province
China Postdoctoral Science Foundation
Fundamental Research Funds for the Central Universities
Open Research Fund of State Key Laboratory of Transient Optics and Photonics
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
51 articles.
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