On-site comparison of Quantum Hall Effect resistance standards of METAS and the BIPM: Ongoing key comparison BIPM.EM-K12
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Published:2018-01-01
Issue:1A
Volume:55
Page:01002
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ISSN:0026-1394
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Container-title:Metrologia
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language:
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Short-container-title:Metrologia
Author:
Gournay Pierre,Rolland Benjamin,Mortara Alessandro,Jeanneret Blaise
Abstract
An on-site comparison of the quantum Hall effect (QHE) resistance standards of the Federal Institute of Metrology METAS (Switzerland) and of the Bureau International des Poids et Mesures (BIPM) was made in December 2017. Measurements of a 100 Ω standard in terms of the conventional value of the von Klitzing constant, R
K-90, agreed to 5 parts in 1010 with a relative combined standard uncertainty u
c = 23 × 10−10.
Scaling from 100 Ω to 10 kΩ has also been addressed through the measurement of a 10000 Ω/100 Ω ratio. The measurements carried out agreed to 2 parts in 1010 with a relative combined standard uncertainty u
c = 19 × 10−10.
Main text
To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/.
The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).
Subject
General Engineering
Cited by
1 articles.
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