Determination of gas adsorption on native oxides formed on Si(100), Si(111) and Si(110) surfaces-Reference-Cited by-同舟云学术

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Determination of gas adsorption on native oxides formed on Si(100), Si(111) and Si(110) surfaces

Published:2005-04-26 Issue:4 Volume:42 Page:208-214
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Mizushima S

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/42/i=4/a=004/pdf

Reference26 articles.

1. Determination of the amount of gas adsorption on SiO2/Si(100) surfaces to realize precise mass measurement

2. Methods to determine water vapour sorption on mass standards

3. Si→SiO2transformation: Interfacial structure and mechanism

4. X-ray scattering studies of the Si-SiO2interface

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure of Carboxyl-Acid-Terminated Self-Assembled Monolayers from Molecular Dynamics Simulations and Hybrid Quantum Mechanics–Molecular Mechanics Vibrational Normal-Mode Analysis;The Journal of Physical Chemistry C;2011-12-21

2. The Avogadro constant determination via enriched silicon-28;Measurement Science and Technology;2009-08-21

3. Ultra-thin SiO2on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2on Si;Surface and Interface Analysis;2009-05

4. The improvement of the adsorption characteristics of stainless steel surfaces by sputter-deposited films;Metrologia;2007-03-20

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