An Interferometric Method to Measure Oscillatory Displacements, 2 nm - 255 nm-Reference-Cited by-同舟云学术

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An Interferometric Method to Measure Oscillatory Displacements, 2 nm - 255 nm

Published:1989-01-01 Issue:2 Volume:26 Page:127-131
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Clark N H

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/26/i=2/a=007/pdf

Reference8 articles.

1. An Improved Method for Calibrating Reference Standard Accelerometers

2. Vibrational Displacement and Mode‐Shape Measurement by a Laser Interferometer

3. Improvement in the interferometric measurement of subangstrom vibrations

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A simple interferometric method to measure the calibration factor and displacement amplification in piezoelectric flextensional actuators;Sba: Controle & Automação Sociedade Brasileira de Automatica;2010-12

2. First level calibrations of accelerometers;Metrologia;1999-08

3. Polarimetric, nonlinearity-free, homodyne interferometer for vibration measurement;Metrologia;1996-12

4. Accelerometer Calibration by Dynamic Position Measurement Using Heterodyne Laser Interferometry;Metrologia;1990-01-01

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