Simultaneous observation of noble gases and highly charged ions in an electron beam ion trap for accurate wavelength calibration of optical transitions

Abstract

Abstract Spectral lines of buffer noble gases injected into an electron beam ion trap (EBIT) have recently been used as a reference to aid accurate determination of the wavelengths of optical transitions of highly charged ions (HCIs). Simultaneous observation of emission lines of HCIs along with those of neutral atoms or singly charged ions represents a reliable method for wavelength calibration that suppresses systematic uncertainties. Here, we present visible and infrared emission spectra of buffer Ne and Ar gases in an EBIT and briefly review the buffer gas calibration method. The experimental conditions required for implementing the calibration method are discussed by investigating the dependence of the emission spectra of mixtures of HCIs and noble gases on electron beam’s parameters and gas pressure.