A high-strain specimen stretching device for the Elmiskop I electron microscope-Reference-Cited by-同舟云学术

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A high-strain specimen stretching device for the Elmiskop I electron microscope

Published:1963-07 Issue:7 Volume:40 Page:358-359
ISSN:0950-7671
Container-title:Journal of Scientific Instruments
language:
Short-container-title:J. Sci. Instrum.

Author:

Andrews E H

Publisher

IOP Publishing

Subject

General Medicine

Link

http://stacks.iop.org/0950-7671/40/i=7/a=310/pdf

Reference5 articles.

1. Spherulite morphology in thin films of natural rubber

2. Specimen Holder for Controlled Deformation in the Elmiskop

3. Apparatus for the Deformation of Foils in an Electron Microscope

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Prinzipieller Aufbau des Durchstrahlungsmikroskopes;Elektronenmikroskopische Untersuchungs- und Präparationsmethoden;1967

2. Microfibrillar textures in polymer fibers;Journal of Polymer Science Part A-2: Polymer Physics;1966-08

3. Electron Microscopy;Analytical Chemistry;1964-04-01

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