A method for the measurement of solid film thicknesses in the 5 to 30 micron range
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Published:1957-08
Issue:8
Volume:34
Page:333-333
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ISSN:0950-7671
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Container-title:Journal of Scientific Instruments
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language:
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Short-container-title:J. Sci. Instrum.
Cited by
3 articles.
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