LUNAR DUST GRAIN CHARGING BY ELECTRON IMPACT: COMPLEX ROLE OF SECONDARY ELECTRON EMISSIONS IN SPACE ENVIRONMENTS-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

LUNAR DUST GRAIN CHARGING BY ELECTRON IMPACT: COMPLEX ROLE OF SECONDARY ELECTRON EMISSIONS IN SPACE ENVIRONMENTS

Published:2010-07-07 Issue:2 Volume:718 Page:795-809
ISSN:0004-637X
Container-title:The Astrophysical Journal
language:
Short-container-title:ApJ

Author:

Abbas M. M.,Tankosic D.,Craven P. D.,LeClair A. C.,Spann J. F.

Publisher

American Astronomical Society

Subject

Space and Planetary Science,Astronomy and Astrophysics

Link

http://stacks.iop.org/0004-637X/718/i=2/a=795/pdf

Reference61 articles.

1. Photoemission Experiments for Charge Characteristics of Individual Dust Grains

2. Lunar dust charging by photoelectric emissions

3. Radiation pressure measurements on micron-size individual dust grains

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrodynamic dust shield efficiency characterisation under UV in vacuum for lunar application;Advances in Space Research;2024-08

2. Possibility of inverse sheath in the lunar nightside due to secondary electron emission;Fundamental Plasma Physics;2024-06

3. Modeling of Electrostatic and Contact Interaction between Low-Velocity Lunar Dust and Spacecraft;Space: Science & Technology;2024-01

4. Development of a comprehensive physics-based model for study of NASA gateway lunar dust contamination;Acta Astronautica;2023-09

5. Experimental study on electrostatic migration of different mineral particles composing lunar dust under electron irradiation;Frontiers in Astronomy and Space Sciences;2023-06-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3