Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy-Reference-Cited by-同舟云学术

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Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy

Published:2016-11-18 Issue:50 Volume:27 Page:505704
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kou Lili,Li Yan Jun,Kamijyo Takeshi,Naitoh Yoshitaka,Sugawara Yasuhiro

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/27/i=50/a=505704/pdf

Reference45 articles.

1. Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

2. New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

3. Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on theTiO2(110)Surface

4. Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of CO molecules on Pd/Al2O3/NiAl(110) surface by atomic force microscopy and Kelvin probe force microscopy;Journal of Nanoparticle Research;2023-06-30

2. High speed mapping of surface charge dynamics via Spiral Scanning Kelvin Probe Force Microscopy;2023-03-17

3. Study of high–low KPFM on a pn-patterned Si surface;Microscopy;2022-01-11

4. Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy;Nano Research;2021-09-25

5. Oxygen-Adsorption-Induced Charge State Change of a Pd Nanocluster on the Al2O3/NiAl(110) Surface;The Journal of Physical Chemistry C;2020-12-31

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