Ab initiosimulation of atomic-scale imaging in noncontact atomic force microscopy
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/20/i=26/a=264006/pdf
Reference52 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
3. True atomic resolution in liquid by frequency-modulation atomic force microscopy
4. Quantitative dynamic-mode scanning force microscopy in liquid
5. Noncontact Atomic Force Microscopy
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