Optimization of the excitation frequency for high probe sensitivity in single-eigenmode and bimodal tapping-mode AFM-Reference-Cited by-同舟云学术

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Optimization of the excitation frequency for high probe sensitivity in single-eigenmode and bimodal tapping-mode AFM

Published:2015-03-31 Issue:16 Volume:26 Page:165703
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Eslami Babak,López-Guerra Enrique A,Diaz Alfredo J,Solares Santiago D

Funder

The George Washington University

Basic Energy Sciences

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=16/a=165703/pdf

Reference42 articles.

1. Dynamic atomic force microscopy methods

2. From Images to Interactions: High-Resolution Phase Imaging in Tapping-Mode Atomic Force Microscopy

3. Nanoscale compositional mapping with gentle forces

4. Fast nanomechanical spectroscopy of soft matter

5. General Theory of Amplitude-Modulation Atomic Force Microscopy

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1. Theoretical and experimental approaches for fluidic AFM operations and rheological measurements using micro-cantilevers;Journal of the Brazilian Society of Mechanical Sciences and Engineering;2024-05-28

2. Observable responses of micro-cantilever array to dynamic acoustic forces at higher mode in the broadband frequency window;Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering;2022-07-03

3. Best practices and recommendations for accurate nanomechanical characterization of heterogeneous polymer systems with atomic force microscopy;Progress in Polymer Science;2021-08

4. Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements;Applied Sciences;2021-07-24

5. Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy;Beilstein Journal of Nanotechnology;2020-06-16

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