Nanomanipulation measurement and PIC simulation of field-emission properties from a single crystallized silicon nano-emitter-Reference-Cited by-同舟云学术

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Nanomanipulation measurement and PIC simulation of field-emission properties from a single crystallized silicon nano-emitter

Published:2007-05-04 Issue:22 Volume:18 Page:225503
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Cheng T C,Hsu K H,Chen P Y,Huang W J,Wu J S,Hsueh H T,Chang M N

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/18/i=22/a=225503/pdf

Reference31 articles.

1. Electron field emission characteristics of electrochemical etched Si tip array

2. Scanning field emission from patterned carbon nanotube films

3. Recent progress in field emitter array development for high performance applications

4. Scanned-probe field-emission studies of vertically aligned carbon nanofibers

5. Self-aligned gated field emission devices using single carbon nanofiber cathodes

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1. The Study of Nano/Micro Electron Field Emitters for Field Emission Beam Applications;2016 3rd International Conference on Green Technology and Sustainable Development (GTSD);2016-11

2. The Study and Fabrication of Electron Field Emission Module for Next-Generation Multi-Beams Lithography Applications;Applied Mechanics and Materials;2013-12

3. Paradox of low field enhancement factor for field emission nanodiodes in relation to quantum screening effects;Nanoscale Research Letters;2012-02-14

4. Nanomanipulation of field emission measurement for vacuum nanodiodes based on uniform silicon nanowire emitters;Applied Physics Letters;2011-04-18

5. Space charge effects in field emission nanodevices;Nanotechnology;2009-09-08

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