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A study on the mechanical and electrical reliability of individual carbon nanotube field emission cathodes

  • Published:2008-04-01 Issue:18 Volume:19 Page:185201
  • ISSN:0957-4484
  • Container-title:Nanotechnology
  • language:
  • Short-container-title:Nanotechnology

Author:

Ribaya Bryan P,Leung Joseph,Brown Philip,Rahman Mahmud,Nguyen Cattien V

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cold field emission electron source: From higher brightness to ultrafast beam;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

2. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

3. Development of an ultra-low-dose fluoroscopy system with real-time frame rate modulation using a fully digital x-ray tube;Medical Imaging 2022: Physics of Medical Imaging;2022-04-04

4. X-ray high frequency pulse emission characteristic and application of CNT cold cathode x-ray source cathode x-ray source;Nanotechnology;2021-11-24

5. Vertically Aligned Carbon Nanotube Microbundle Arrays for Field-Emission Applications;ACS Applied Nano Materials;2020-07-10
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