A nickel silicide nanowire microscopy tip obtains nanoscale information-Reference-Cited by-同舟云学术

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A nickel silicide nanowire microscopy tip obtains nanoscale information

Published:2008-11-12 Issue:48 Volume:19 Page:485713
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kim Joondong,Shin Young-Hyun,Yun Ju-Hyung,Han Chang-Soo,Hyun Moon Seop,Anderson Wayne A

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/19/i=48/a=485713/pdf

Reference14 articles.

1. Nanoelectronics from the bottom up

2. Nanowire arrays build themselves

3. Nanofabrication

4. Self-assembled nanobridge formation and spontaneous growth of metal-induced nanowires

5. Direct Electrical Measurement of the Self-Assembled Nickel Silicide Nanowire

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2. Enhancing dielectric and piezoelectric properties of micro-ZnO/PDMS composite-based dielectrophoresis;Materials & Design;2020-07

3. Electrical and optical properties of Ni-assisted grown single crystalline and transparent indium-tin-oxide nanowires;Materials Science in Semiconductor Processing;2016-06

4. Structure and morphology of Ge nanowires on Si (001): Importance of the Ge islands on the growth direction and twin formation;Journal of Applied Physics;2015-02-07

5. Influence of temperature, metal layer, and groove angle in the nanowire growth: a prospective study on nickel silicide nanowires;Journal of Nanoparticle Research;2015-01

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