Investigation of fabrication parameters for the electron-beam-induced deposition of contamination tips used in atomic force microscopy
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Reference19 articles.
1. Tip artifacts of microfabricated force sensors for atomic force microscopy
2. Scanning tunneling microscopy on rough surfaces: Tip‐shape‐limited resolution
3. Atomic force microscopy using ZnO whisker tip
4. Sharp, vertical-walled tips for SFM imaging of steep or soft samples
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