GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy-Reference-Cited by-同舟云学术

GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy

Published:2014-09-26 Issue:41 Volume:25 Page:415502
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Weber Joel C,Blanchard Paul T,Sanders Aric W,Gertsch Jonas C,George Steven M,Berweger Samuel,Imtiaz Atif,Coakley Kevin J,Wallis Thomas M,Bertness Kris A,Kabos Pavel,Sanford Norman A,Bright Victor M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Reference43 articles.

1. Growth of nanotubes for probe microscopy tips

2. Nanotubes as nanoprobes in scanning probe microscopy

3. Scanning tunneling microscopy with InAs nanowire tips

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