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Identifying single electron charge sensor events using wavelet edge detection

Published:2015-05-01 Issue:21 Volume:26 Page:215201
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Prance J R,Bael B J Van,Simmons C B,Savage D E,Lagally M G,Friesen Mark,Coppersmith S N,Eriksson M A

Funder

Army Research Office:

U.S. Department of Energy:

Division of Materials Research:

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=21/a=215201/pdf

Reference45 articles.

1. Measurements of Coulomb blockade with a noninvasive voltage probe

2. Few-electron quantum dot circuit with integrated charge read out

3. Manipulation of a Single Charge in a Double Quantum Dot

4. Single-shot measurement of the Josephson charge qubit

5. Coherent quantum oscillations and echo measurements of a Si charge qubit

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Silicon spin qubit noise characterization using real-time feedback protocols and wavelet analysis;Applied Physics Letters;2024-03-11

2. Threshold-independent method for single-shot readout of spin qubits in semiconductor quantum dots;Chinese Physics B;2023-12-01

3. Electrostatic control of quasiparticle poisoning in a hybrid semiconductor-superconductor island;Physical Review B;2023-07-18

4. Corrigendum: Identifying single electron charge sensor events using wavelet edge detection (2015 Nanotechnology 26 215201);Nanotechnology;2021-12-28

5. Noise-robust classification of single-shot electron spin readouts using a deep neural network;npj Quantum Information;2021-09-09

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