Application of nano-EBIC to the characterization of GaAs and InP homojunctions
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/19/i=15/a=155706/pdf
Reference22 articles.
1. Scanning near-field cathodoluminescence microscopy
2. Near-field detection cathodoluminescence investigations
3. Scanning near-field electron beam induced current microscopy: Application to III-V heterostructures and quantum dots
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