Insituthickness measurements of ultra-thin multilayer polymer films by atomic force microscopy-Reference-Cited by-同舟云学术

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Insituthickness measurements of ultra-thin multilayer polymer films by atomic force microscopy

Published:1999-12-01 Issue:4 Volume:10 Page:389-393
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Lobo R F M,Pereira-da-Silva M A,Raposo M,Faria R M,Oliveira O N,Pereira-da-Silva M A,Faria R M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/10/i=4/a=305/pdf

Reference17 articles.

1. Measurement of optical constants of thin polymer films using spectrally resolved white light interferometry

2. Quantitative topography measurements of rolled aluminium surfaces by atomic force microscopy and optical methods

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