Charge-based scanning probe readback of nanometer-scale ferroelectric domain patterns at megahertz rates-Reference-Cited by-同舟云学术

Charge-based scanning probe readback of nanometer-scale ferroelectric domain patterns at megahertz rates

Published:2009-05-13 Issue:22 Volume:20 Page:225501
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Forrester Martin G,Ahner Joachim W,Bedillion Mark D,Bedoya Cedric,Bolten Dierk G,Chang Kai-Chieh,de Gersem Gudrun,Hu Shan,Johns Earl C,Nassirou Maissarath,Palmer Jason,Roelofs Andreas,Siegert Markus,Tamaru Shingo,Vaithyanathan Venugopalan,Zavaliche Florin,Zhao Tong,Zhao Yongjun

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/20/i=22/a=225501/pdf

Reference20 articles.

1. Thermal stability of recorded information at high densities

2. Recording potential of bit-patterned media

3. Ultimate limits to thermally assisted magnetic recording

4. Nanoscale control of ferroelectric polarization and domain size in epitaxial Pb(Zr0.2Ti0.8)O3 thin films

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