Direct patterning of zinc oxide with control of reflected color through nano-oxidation using an atomic force microscope-Reference-Cited by-同舟云学术

Direct patterning of zinc oxide with control of reflected color through nano-oxidation using an atomic force microscope

Published:2009-01-09 Issue:5 Volume:20 Page:055302
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Hwang Jih-Shang,Chen Li-Wei,Chen Te-Chang,Kuo Chi-Wen,Hu Zhan-Shuo,Tsai Tsong-Ru,Wu Yuen-Jung,Lin Tai-Yuan,Jhuo Yuan-Yu,Cheng Chih-Yung,Lin Chih-Ming,Liu Yi-Hung

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/20/i=5/a=055302/pdf

Reference31 articles.

1. A metal/oxide tunneling transistor

2. Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges

3. Terabit-per-square-inch data storage with the atomic force microscope

4. Room-temperature single-electron memory made by pulse-mode atomic force microscopy nano oxidation process on atomically flat α-alumina substrate

5. Nano-oxidation of silicon nitride films with an atomic force microscope: Chemical mapping, kinetics, and applications

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