Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data-Reference-Cited by-同舟云学术

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Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data

Published:2013-07-26 Issue:33 Volume:24 Page:335703
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Ziegler Dominik,Meyer Travis R,Farnham Rodrigo,Brune Christoph,Bertozzi Andrea L,Ashby Paul D

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/24/i=33/a=335703/pdf

Reference40 articles.

1. Atomic Force Microscope

2. Surface Studies by Scanning Tunneling Microscopy

3. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

4. A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 °C

5. Force gradient sensitive detection in lift-mode Kelvin probe force microscopy

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