Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever-Reference-Cited by-同舟云学术

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Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever

Published:2012-11-13 Issue:49 Volume:23 Page:495302
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kim Hoe Joon,Moldovan Nicolaie,Felts Jonathan R,Somnath Suhas,Dai Zhenting,Jacobs Tevis D B,Carpick Robert W,Carlisle John A,King William P

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/23/i=49/a=495302/pdf

Reference31 articles.

1. Atomic Force Microscope

2. The "millipede" - nanotechnology entering data storage

3. Topography imaging with a heated atomic force microscope cantilever in tapping mode

4. Measuring material softening with nanoscale spatial resolution using heated silicon probes

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4. A Review on Principles and Applications of Scanning Thermal Microscopy (SThM);Advanced Functional Materials;2019-09-02

5. One Second Formation of Large Area Graphene on a Conical Tip Surface via Direct Transformation of Surface Carbide;Small;2018-06-25

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