Correlation between the performance and microstructure of Ti/Al/Ti/Au Ohmic contacts to p-type silicon nanowires-Reference-Cited by-同舟云学术

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Correlation between the performance and microstructure of Ti/Al/Ti/Au Ohmic contacts to p-type silicon nanowires

Published:2011-01-14 Issue:7 Volume:22 Page:075206
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Motayed Abhishek,Bonevich John E,Krylyuk Sergiy,Davydov Albert V,Aluri Geetha,Rao Mulpuri V

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/22/i=7/a=075206/pdf

Reference49 articles.

1. Silicon nanowire devices

2. Silicon Vertically Integrated Nanowire Field Effect Transistors

3. Spin States of the First Four Holes in a Silicon Nanowire Quantum Dot

4. Functional Nanoscale Electronic Devices Assembled Using Silicon Nanowire Building Blocks

5. Nanoscale avalanche photodiodes for highly sensitive and spatially resolved photon detection

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4. Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays;Sensors;2021-07-29

5. CMOS-Compatible Silicon Nanowire Field-Effect Transistor Biosensor: Technology Development toward Commercialization;Materials;2018-05-11

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