Errors in nanometrology by SEM
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/15/i=9/a=015/pdf
Reference12 articles.
1. Real and apparent grain sizes in chemical vapor deposited diamond
2. Growth of high-quality single-wall carbon nanotubes without amorphous carbon formation
3. Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
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