Simulation of lateral manipulation with dynamic AFM: interchange of Sn and Ge adatoms on Ge(111)-c(2 × 8) surface
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/18/i=8/a=084016/pdf
Reference26 articles.
1. Noncontact Atomic Force Microscopy
2. Dynamic atomic force microscopy methods
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5. Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy
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1. First-principles study of lateral atom manipulation assisted by structural relaxation of a scanning tip apex;Physical Review B;2017-10-06
2. Multistep atomic reaction enhanced by an atomic force microscope probe on Si(111) and Ge(111) surfaces;Physical Review B;2016-08-17
3. Effects of damping and stiffness of AFM cantilever on the imaging of fine surfaces;Microscopy Research and Technique;2016-08-03
4. Dynamic modeling for nanomanipulation of polystyrene nanorod by atomic force microscope;Scientia Iranica;2011-06
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