Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy-Reference-Cited by-同舟云学术

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Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy

Published:2006-08-22 Issue:18 Volume:17 Page:4581-4587
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Fumagalli L,Ferrari G,Sampietro M,Casuso I,Martínez E,Samitier J,Gomila G

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/17/i=18/a=009/pdf

Reference34 articles.

1. Atomic Force Microscope

2. Local Phenomena in Oxides by Advanced Scanning Probe Microscopy

3. Atomic force microscopy modified for studying electric properties of thin films and crystals. Review

4. Kelvin probe force microscopy

5. Conducting atomic force microscopy study of silicon dioxide breakdown

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