Author:
Chetwynd D G,Schwarzenberger D R,Bowen D K
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Cited by
9 articles.
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1. Displacement Measurement;Fundamental Principles of Engineering Nanometrology;2014
2. Displacement measurement;Fundamental Principles of Engineering Nanometrology;2010
3. Applications of x-ray interferometer-generated Moiré patterns;Nanotechnology;1998-06-01
4. Applications of X-Ray Interferometry;X-Ray and Neutron Dynamical Diffraction;1996
5. Angular measurements with X-ray interferometry;Journal of Applied Crystallography;1992-06-01