Annealing temperature dependence of structural and electrical properties of Sb2Te and GeInSbTe thin films-Reference-Cited by-同舟云学术

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Annealing temperature dependence of structural and electrical properties of Sb2Te and GeInSbTe thin films

Published:2015-12-04 Issue:12 Volume:2 Page:126401
ISSN:2053-1591
Container-title:Materials Research Express
language:
Short-container-title:Mater. Res. Express

Author:

Singh J,Goutam U K,Aswal D K,Gupta S K

Publisher

IOP Publishing

Subject

Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/2053-1591/2/i=12/a=126401/pdf

Reference21 articles.

1. Phase-change materials for rewriteable data storage

2. Reversible Electrical Switching Phenomena in Disordered Structures

3. Towards a universal memory?

4. Phase change materials and phase change memory

5. Phase change materials in non-volatile storage

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermoelectric Effects on Amorphization Process of Blade-Type Phase Change Random Access Memory;IEEE Transactions on Electron Devices;2021-12

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