Influence of displacement constraints to the surface reconstruction of stressed bicrystal thin films

Author:

Akyildiz OncuORCID

Abstract

Abstract In this work, surface morphology evolution of bicrystal thin films under the combined action of grain boundary and surface diffusion is investigated by considering different mechanical constraints. 2D surface topographies of thin films, that are (a) freestanding, (b) strongly bonded to its substrate and (c) strongly bonded to its substrate and one of sidewalls, are simulated using a numerical implementation of an irreversible thermo-kinetics model. Relationships which give the groove depth as a function of time are obtained. Results show that mechanical loading conditions are effective in determining the morphology and kinetics of grooving. For the three scenarios that had been investigated, it was found that the groove depth evolves linearly with different tip velocities under the same level of uniaxial tension. In freestanding films groove tip evolves faster; i.e. as the film gets constrained from its substrate and/or one of its sidewalls, the tip velocity slows down. It was also observed that high triple junction mobilities at low levels of applied stress hinder the effects of displacement constraints to groove shape, even in the case of asymmetric stress distributions inside the film. On the other hand, low triple junction mobilities at moderate applied stresses allow formation of asymmetric grain boundary grooves due to the induced asymmetry in the driving force for surface diffusion with respect to the grain boundary.

Funder

Turkish Scientific and Technical Research Council, TUBITAK

Publisher

IOP Publishing

Subject

Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Creep cavitation in metals;Kassner;Int. J. Plast.,2003

2. Mechanical properties of thin films;Nix;Metall. Trans. A. Phys. Metall. Mater. Sci.,1989

3. Mechanical behavior of thin films;Vinci;Annu. Rev. Mater. Sci.,1996

4. Measurement of stresses in thin films and their relaxation;Kraft,2005

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