The growth mechanisms of TiO2 film onto PET surfaces by atomic layer deposition

Author:

Riyanto EdyORCID,Dedi ,Fudholi Ahmad,Ying Guo,Jing Zhang,Jianjun Shi,Gaoshan Huang,Yongfeng Mei

Abstract

Abstract Atomic layer deposition (ALD) was used to coat a polyethylene terephthalate (PET) polymer substrate with TiO2 film. The TiO2 was grown onto the surface with better film coverage by using thicker ALD deposition. Further evaluation on the coated substrates indicated that the reactive sites of –C=O that existed on PET surface played a significant contribution to facilitating the initial ALD growth of the TiO2 thin film. The chemical composition of the coated substrates was characterised using energy dispersive X-ray spectroscopy, which showed that increasing the TiO2 film thickness increased the Ti element content. Two growth mechanisms, namely, diffusion growth and direct coordination through the precursor coordination with surface reactive sites of –C=O with product release occurred simultaneously in the initial growth of TiO2 coating onto PET polymer by ALD. The surface alteration of the coated ALD was characterised by Fourier transform infrared spectroscopy, which showed that the hydroxyl –OH groups emerged in the TiO2 ALD film.

Funder

National Research and Innovation Agency of the Republic of Indonesia

Publisher

IOP Publishing

Subject

Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. Low-temperature atomic layer deposition of Al2O3 on blown polyethylene films with plasma-treated surfaces;Lee;J. Vac. Technol. A,2012

2. Atomic layer deposition of TiO2-nanomembrane-based photocatalysts with enhanced performance;Edy;AIP. Adv.,2016

3. Effect of Al2O3 ALD coating and vapor infusion on the bulk mechanical response of elastic and viscoelastic polymers;McClure;Surf. Coat. Technol.,2015

4. Atmospheric pressure atomic layer deposition of Al2O3 using trimethyl aluminum and ozone;Mousa;Langmuir,2014

5. Mechanistic details of atomic layer deposition (ALD) processes;Xu;J. Kor. Chem. Soc.,2007

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Nucleation and Growth Study of Al2O3 Film Fabricated Through Atomic Layer Deposition on Pet Substrate;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3