Non-Invasive Measurements of Thickness of Superconductor Films by Using Two-Resonant-Mode Rutile Resonator
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/0256-307X/27/8/087405/pdf
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Noninvasive thickness measurements of metal films through microwave dielectric resonators;Electronic Materials Letters;2016-05
2. Improved measurement accuracy for the thickness of YBa2Cu3O7−δ films by using a single two-resonance-mode sapphire resonator;Journal of the Korean Physical Society;2012-04
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