Raman Analysis of a Crystalline SiC Sample Prepared from Carbon-Saturated Melt of Silicon
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Reference12 articles.
1. Characterization of diamond films by Raman spectroscopy
2. MicroRaman study of crystallographic defects in SiC crystals
3. Second-order Raman spectra of SiC: Experimental and theoretical results fromab initiophonon calculations
4. Spatial characterization of doped SiC wafers by Raman spectroscopy
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2. (Ta,Nb)C composites formed with graphene nanoplatelets by spark plasma sintering;Journal of the European Ceramic Society;2017-09
3. Origin of white light luminescence from Si+/C+ sequentially implanted and annealed silica;Journal of Applied Physics;2012-04-15
4. Effect of doping on the Raman scattering of 6H-SiC crystals;Physica B: Condensed Matter;2010-05
5. Raman Scattering Detection of Stacking Faults in Free-Standing Cubic-SiC Epilayer;Chinese Physics Letters;2006-09-27
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