Fabrication of 11-nm-Wide Silica-Like Lines Using X-Ray Diffraction Exposure

Author:

Xiao-Li Zhu,Chang-Qing Xie,Man-Hong Zhang,Ming Liu,Bao-Qin Chen,Feng Pan

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Molecular dynamics study of structural damage in amorphous silica induced by swift heavy-ion radiation;Radiation Effects and Defects in Solids;2016-03-03

2. Quantifying reaction spread and x-ray exposure sensitivity in hydrogen silsesquioxane latent resist patterns with x-ray spectromicroscopy;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-11

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