Author:
Lu Xue-Hui,Jing Cheng-Bin,Wang Lian-Wei,Chu Jun-Hao
Abstract
We design and fabricate a good performance silicon photoconductive terahertz detector on sapphire substrates at room temperature. The best voltage responsivity of the detector is 6679V/W at frequency 300 GHz as well as low voltage noise of 3.8 nV/Hz1/2 for noise equivalent power 0.57 pW/Hz1/2. The measured response time of the device is about
9
μ
s
, demonstrating that the detector has a speed of
>
110
kHz
. The achieved good performance, together with large detector size (acceptance area is 3
μ
m
×
160
μ
m
), simple structure, easy manufacturing method, compatibility with mature silicon technology, and suitability for large-scale fabrication of imaging arrays provide a promising approach to the development of sensitive terahertz room-temperature detectors.
Subject
General Physics and Astronomy
Cited by
4 articles.
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