Positional deviation detection of silicone caps on FPCB

Author:

Li Dejian,Li Shaoli,Yuan Weiqi

Abstract

Purpose The purpose of this paper is to propose a defect detection method of silicone caps positional deviation on flexible printed circuit board (FPCB) of keyboard based on automatic optical inspection. Design/methodology/approach First, the center of silicone caps of target keyboard FPCB image was extracted as feature points for generating the feature image which is used for registration rigidly with the reference feature image generated from the CAD drawings. Then, a flexible image registration method based on the surrounding-control-center B-splines (SCCB) strategy was proposed, which could correct the flexible deformation of the image generated by FPCB substrate while keeping the pasting deviation information about silicone caps unchanged. Finally, on this basis, a nearest neighbor strategy was proposed to detect the positional deviation of silicone caps. Findings Experimental results show that the proposed method can effectively detect the positional deviation defect of silicone caps. The G-mean value of the proposed method is 0.941746, which is 0.3 higher compared to that of similar research. Originality/value This paper presents a method to detect positional deviation defect of silicone caps on keyboard FPCB. Different from the classic B-spline image registration method, the proposed SCCB method used the neighborhood information of the pixel to be registered selectively to calculate the displacement vector needed for its registration, which overcame the problem that the silicone cap pasting deviation information disappears with the correction of the flexible deformation of the image.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference29 articles.

1. Improved normalized cross-correlation for defect detection in printed-circuit boards;IEEE Transactions on Semiconductor Manufacturing,2019

2. A novel coarse-fine method for ball grid array component positioning and defect inspection;IEEE Transactions on Industrial Electronics,2018

3. A wearable WPT system on flexible substrates;IEEE Antennas and Wireless Propagation Letters,2019

4. Two and three dimensional image registration based on B-splines composition and level sets;Communications in Computational Physics,2017

5. Automatic defect inspection of patterned FPC board based on 1-D fourier reconstruction,2017

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3