CSP compatibility in the SMT assembly process

Author:

Alex Chen L.,Sterian Irene,Smith Brian,Kirkpatrick Damien

Abstract

To achieve integration of chip scale package (CSP) devices into main stream surface mount technology (SMT) assembly, various experiments have been required. In process development, experiences learned from flip chip attach and ball grid array (BGA) assembly were utilized. Key process parameters for CSP assembly were defined and some of those key factors were optimized. They will be presented in this paper. Some observations during prototype build have been documented for correlation with reliability results in the future. The requirements for further CSP assembly studies will also be addressed in this paper.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference4 articles.

1. Chen, A., Sterian, I., Arrowsmith, P., Sack, T. and Baragetti, G. (1997), “Integrate CSP into main stream SMT assembly process”, Advancing Microelectronics, Nov/Dec, pp. 24‐7.

2. Clouthier, R.S. (1997), “SMT printing process for fine and ultra fine pitch”, Surface Mount International, San Jose, CA., September 7‐11, pp. 674‐86.

3. Horsley, R.M., Ekere, N.N. (1997), “Causes of voiding in plastic ball grid array eutectic solder joints”, Soldering & Surface Mount Technology, Vol. 9 No. 3, pp.18‐22.

4. Sterian, I., Chen, A., Quan, C., Mohabir, R., Bragg, J. and Chang, K. (1998), “Compatibility of CSPs in SMT assembly”, Surface Mount International, San Jose, CA, August 23‐27, pp. 225‐30.

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