A study of testing‐effort dependent inflection S‐shaped software reliability growth models with imperfect debugging

Author:

Ahmad N.,Khan M.G.M.,Rafi L.S.

Abstract

PurposeThe purpose of this paper is to investigate how to incorporate the exponentiated Weibull (EW) testing‐effort function (TEF) into inflection S‐shaped software reliability growth models (SRGMs) based on non‐homogeneous Poisson process (NHPP). The aim is also to present a more flexible SRGM with imperfect debugging.Design/methodology/approachThis paper reviews the EW TEFs and discusses inflection S‐shaped SRGM with EW testing‐effort to get a better description of the software fault detection phenomenon. The SRGM parameters are estimated by weighted least square estimation (WLSE) and maximum‐likelihood estimation (MLE) methods. Furthermore, the proposed models are also discussed under imperfect debugging environment.FindingsExperimental results from three actual data applications are analyzed and compared with the other existing models. The findings reveal that the proposed SRGM has better performance and prediction capability. Results also confirm that the EW TEF is suitable for incorporating into inflection S‐shaped NHPP growth models.Research limitations/implicationsThis paper presents the WLSE results with equal weight. Future research may be carried out for unequal weights.Practical implicationsSoftware reliability modeling and estimation are a major concern in the software development process, particularly during the software testing phase, as unreliable software can cause a failure in the computer system that can be hazardous. The results obtained in this paper may facilitate the software engineers, scientists, and managers in improving the software testing process.Originality/valueThe proposed SRGM has a flexible structure and may capture features of both exponential and S‐shaped NHPP growth models for failure phenomenon.

Publisher

Emerald

Subject

Strategy and Management,General Business, Management and Accounting

Reference39 articles.

1. Ahmad, N., Khan, M.G.M. and Rafi, L.S. (2008a), “Inflection S‐shaped software reliability growth models with testing‐effort functions”, Proceedings of the VI International Symposium on Optimization and Statistics, Aligarh Muslim University, Aligarh, India, 29‐31 December.

2. Ahmad, N., Bokhari, M.U., Quadri, S.M.K. and Khan, M.G.M. (2008b), “The exponentiated Weibull software reliability growth model with various testing‐efforts and optimal release policy: a performance analysis”, International Journal of Quality & Reliability Management, Vol. 25 No. 2, pp. 211‐35.

3. Ahmad, N., Khan, M.G.M., Quadri, S.M.K. and Kumar, M. (2009), “Modeling and analysis of software reliability with Burr type X testing‐effort and release‐time determination”, Journal of Modelling in Management, Vol. 4 No. 1, pp. 28‐54.

4. Bokhari, M.U. and Ahmad, N. (2006), “Analysis of a software reliability growth models: the case of log‐logistic test‐effort function”, Proceedings of the 17th IASTED International Conference on Modeling and Simulation (MS'2006), Montreal, Canada, pp. 540‐5.

5. Bokhari, M.U. and Ahmad, N. (2007), “Software reliability growth modeling for exponentiated Weibull functions with actual software failures data”, Advances in Computer Science and Engineering: Reports and Monographs, Vol. 2, pp. 390‐6.

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