SMT assembly effects on organic substrate lifetime reduction

Author:

Huh Seok-Hwan

Abstract

Purpose The purpose of this study is that the effects of surface mount technology (SMT) assembly process on the product lifetime of fine-pitch printed circuit boards (PCBs) were investigated under biased highly accelerated stress testing (HAST). Design/methodology/approach SMT assembly from a semiconductor SMT assembly process was replicated to test PCBs under the same conditions as SMT-assembled PCBs. The median lives µ and standard deviation s of the test PCBs were calculated from the log-normal distribution. The failure analysis of current leakages was conducted by the focused ion beam, scanning electron microscopy and energy-dispersive X-ray spectroscopy. Using the inverse power law and modified Peck-H’s relationship, the PCB lives at accelerated (by SMT assembly stress) and user conditions were calculated. Findings The failure analysis demonstrated that SiO2 and BaSO4 fillers added for stiffening organic materials promote current leakage failure. Therefore, the hydrophobicity of these fillers is believed to be necessary to suppress the current leakage failure under biased HAST. The inverse power law model indicates that the acceleration life model with SMT assembly stress can be given as follows: L(V) = 271.9(S)−0.5031. From modified Peck-H’s relationship, after the third SMT assembly, the time required to attain 0.96 per cent failures at 35°C/60 per cent RH/1.9 V and 130°C/85 per cent RH/3.5 V are 129 y and 69.5 h, respectively. The biased HAST at 130°C/85 per cent/3.5 V after the third SMT assembly for 69.5 h on 238 samples could be recommended as an early quality-monitoring procedure. Research limitations/implications In the future, the failure modes in an early stage of a bathtub should be analyzed and the life prediction model should be studied accordingly. Originality/value Through this study, the lifetime prediction model and early quality-monitoring procedure for organic substrates because of SMT assembly stress were obtained.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

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