Refining the physical description of charge trapping and detrapping in a transport model for dielectrics using an optimization algorithm
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Published:2023-11-14
Issue:6
Volume:42
Page:1923-1937
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ISSN:0332-1649
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Container-title:COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
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language:en
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Short-container-title:COMPEL
Author:
Hallak Khaled,Baudoin Fulbert,Griseri Virginie,Bugarin Florian,Segonds Stephane,Le Roy Severine,Teyssedre Gilbert
Abstract
Purpose
The purpose of this paper is to optimize and improve a bipolar charge transport (BCT) model used to simulate charge dynamics in insulating polymer materials, specifically low-density polyethylene (LDPE).
Design/methodology/approach
An optimization algorithm is applied to optimize the BCT model by comparing the model outputs with experimental data obtained using two kinds of measurements: space charge distribution using the pulsed electroacoustic (PEA) method and current measurements in nonstationary conditions.
Findings
The study provides an optimal set of parameters that offers a good correlation between model outputs and several experiments conducted under varying applied fields. The study evaluates the quantity of charges remaining inside the dielectric even after 24 h of short circuit. Moreover, the effects of increasing the electric field on charge trapping and detrapping rates are addressed.
Research limitations/implications
This study only examined experiments with different applied electric fields, and thus the obtained parameters may not suit the experimental outputs if the experimental temperature varies. Further improvement may be achieved by introducing additional experiments or another source of measurements.
Originality/value
This work provides a unique set of optimal parameters that best match both current and charge density measurements for a BCT model in LDPE and demonstrates the use of trust region reflective algorithm for parameter optimization. The study also attempts to evaluate the equations used to describe charge trapping and detrapping phenomena, providing a deeper understanding of the physics behind the model.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computational Theory and Mathematics,Computer Science Applications