Defect localization and characterization in eddy current nondestructive testing by change detection and global optimization

Author:

Kermadi Majda,Moussaoui Saïd,Taieb Brahimi Abdelhalim,Feliachi Mouloud

Abstract

PurposeThis paper aims to present a data-processing methodology combining kernel change detection (KCD) and efficient global optimization algorithms for solving inverse problem in eddy current non-destructive testing. The main purpose is to reduce the computation cost of eddy current data inversion, which is essentially because of the heavy forward modelling with finite element method and the non-linearity of the parameter estimation problem. Design/methodology/approachThe KCD algorithm is adapted and applied to detect damaged parts in an inspected conductive tube using probe impedance signal. The localization step allows in reducing the number of measurement data that will be processed for estimating the flaw characteristics using a global optimization algorithm (efficient global optimization). Actually, the minimized objective function is calculated from data related to defect detection indexes provided by KCD. FindingsSimulation results show the efficiency of the proposed methodology in terms of defect detection and localization; a significant reduction of computing time is obtained in the step of defect characterization. Originality/valueThis study is the first of its kind that combines a change detection method (KCD) with a global optimization algorithm (efficient global optimization) for defect detection and characterization. To show that such approach allows to reduce the numerical cost of ECT data inversion.

Publisher

Emerald

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computational Theory and Mathematics,Computer Science Applications

Reference48 articles.

1. Non destructive evaluation in the time domain;COMPEL - the International Journal for Computation and Mathematics in Electrical and Electronic Engineering,1999

2. An svm approach to crack shape reconstruction in eddy current testing,2006

3. Crack shape reconstruction in eddy current testing using machine learning systems for regression;IEEE Transactions on Instrumentation and Measurement,2008

4. Kriging for eddy-current testing problems;IEEE Transactions on Magnetics,2010

5. Characterization of a 3d defect using the expected improvement algorithm;Compel - the International Journal for Computation and Mathematics in Electrical and Electronic Engineering,2008

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3