Direct structural observation of a molecular junction by high-energy x-ray reflectometry
Author:
Publisher
Proceedings of the National Academy of Sciences
Subject
Multidisciplinary
Reference19 articles.
1. Surface Raman spectra of a biased and buried ultrathin copper phthalocyanine layer
2. In Situ Raman Spectroscopy of Bias-Induced Structural Changes in Nitroazobenzene Molecular Electronic Junctions
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