Improvement and application of YOLOv3 for defect detection of smart phone glass covers
Author:
WU Ji-gang, ,CHENG Yuan,SHAO Jun,YANG De-qiang
Publisher
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Subject
Instrumentation,Signal Processing,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. 基于改进BiSeNet V2的手机盖板缺陷检测方法;Acta Optica Sinica;2024
2. Few-shot metric learning network for steel surface defect detection;Fifth International Conference on Mechatronics and Computer Technology Engineering (MCTE 2022);2022-12-16