Hollow-cone illumination in simulated ADF STEM

Author:

Loane R. F.,Silcox J.

Abstract

The overlap regions between CBED disks are a source of lattice fringe contrast in ADF STEM images of crystals. For sufficiently small lattice spacings, the Scherzer focus convergence angle is too small for the CBED disks to overlap, and the lattice is not visible. By increasing the convergence angle beyond the Scherzer angle to create an overlap region, and by using stationary phase defocus, smaller lattices can be imaged However, with larger convergence angles, lens aberrations spread the incident beam and small aperiodic structures, such as adatoms, become difficult to image. If the specimen Bragg angle is known, an annular objective aperture can be designed to pass the overlap regions of the incident beam, while blocking the central, non-overlap region which produces a large constant background. The annular probe size is minimized by choosing an annulus width and defocus which balance the spherical aberration across the annulus (close to stationary phase defocus). Simulations indicate hollow cone illumination may allow both adatoms and smaller lattices to be imaged simultaneously. This approach presumes knowledge of the specimen, and must be used in conjunction with standard methods for correct image interpretation. An incorrectly applied annulus will produce image artifacts.

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Reference5 articles.

1. Stem microanalysis by transmission electron energy loss spectroscopy in crystals

2. 5. Special thanks to Earl J. Kirkland for his valuable criticism. This research was supported by the Department of Energy (grant DEFG0287ER45322). Calculations were performed at the Cornell National Supercomputer Facility, a resource of the Center for Theory and Simulation in Science and Engineering at Cornell University, which is funded in part by the National Science Foundation, New York State, and the IBM Corporation.

3. Simulation of annular dark field stem images using a modified multislice method

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1. The Programs;Advanced Computing in Electron Microscopy;2020

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