Study of cobalt oxide films deposited on single-crystal yttria-stabilized zirconia by pulsed-laser ablation

Author:

Ramamurthy Sundar,McKernan Stuart,Barry Carter C.

Abstract

One of the most common applications of pulsed-laser ablation (PLA) is the production of oxide films of almost any stoichiometry. In this work, thin films of cobalt oxide were grown onto single-crystal yttria-stabilized zirconia (YSZ) substrates of (100) orientation. Film morphology during the early stages of growth has been studied.Cobalt oxide films grown on suitable substrates have potential applications in electronic and magnetic devices. Like most transition metal oxides, cobalt oxide exists in more than one form, depending on the valence of the cations and their distribution . The transition from CoO to Co3O4 occurs at about 900°C in air, CoO being the high-temperature phase. However, by lowering the partial pressure of oxygen, the CoO stability region shifts down to much lower temperatures.The laser system used for the depositions was a Lambda Physik model 210i with KrF excimer laser (λ=248 nm) operating at an energy of 200 mJ per pulse. A Co3O4 pellet (96% dense) was fabricated as the target material.

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Reference7 articles.

1. 7. Reserach supported by NSF under grant No. DMR-8901218, and in part by the user program of the HTML Facility at Oak Ridge National Labs and by the DoE under contract DE-AC05-84OR21400 with Martin Marietta Energy Systems, Inc.

2. Interfacial Reactions During Processing of Thin Nickel Oxide Films Grown by Pulsed-Laser Ablation

3. Microstructure of hardened and softened zirconia after xenon implantation

4. 1. See for example, papers in Mater. Res. Soc. Symp. Proc. 191 (1990)

5. 6. McKernan, S. , Ramamurthy, S. and Carter, C. B. , these proceedings

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Growth of Rock-Salt and Spinel Structured Oxides on α-Al2O3, c-ZrO2and MgO;MRS Proceedings;1994

2. The (111)/(100) interface in cubic materials;Proceedings, annual meeting, Electron Microscopy Society of America;1994

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