Measurement of PCTF parameters with high accuracy-Reference-Cited by-同舟云学术

Measurement of PCTF parameters with high accuracy

Published:1992-08 Issue:1 Volume:50 Page:136-137
ISSN:0424-8201
Container-title:Proceedings, annual meeting, Electron Microscopy Society of America
language:en
Short-container-title:Proc. annu. meet. Electron Microsc. Soc. Am.

Author:

de Jong A.F.,Coene W.M.J.,Koster A.J.

Abstract

Measurement of electron-optical parameters in TEM is important for two reasons: a) for automatic correction of focus, astigmatism and beam-tilt misalignment (autotuning) and b) for the accurate determination of the phase-contrast transfer function (PCTF) which is needed for a correct interpretation of high-resolution electron microscopy (HREM) images. This paper addresses specifically methods adapted to reach the second goal, stressing accuracy rather than speed and robusteness.

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Reference6 articles.

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