Resolution-Limiting Effects in Electron Microscope Images

Author:

Anstis G. R.,O'Keefe M. A.

Abstract

The resolution of a high-resolution lattice image is usually regarded as being set by the size of the objective aperture used in obtaining the image. However, experimental structure images (i.e. images obtained at optimum defocus) do not usually obtain the resolution one might expect merely from a consideration of the spatial frequencies of the beams contributing to the image. Structure images obtained by Iijima (1) (e.g. Fig. 4a), with an objective aperture admitting beams corresponding to a resolution of 3. 8Å at lOOkeV, show instead a resolution of 3. 8Å. This loss of resolution may be viewed as occurring due to the imposition of a virtual aperture by the resolution- limiting factors of chromatic aberration and incident electron beam convergence.

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms;Microscopy and Microanalysis;2004-01-22

2. Sub-Ångstrom high-resolution transmission electron microscopy at 300keV;Ultramicroscopy;2001-11

3. Sub-ångström resolution of atomistic structures below 0.8 Å;Philosophical Magazine B;2001-11

4. Electron-optical imaging of Ti6O11at 1·6 Å point-to-point resolution;Philosophical Magazine A;1978-12

5. Electron Microdiffraction;Advances in Electronics and Electron Physics Volume 46;1978

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