Author:
Nishioka H.,Kawasumi T.,Ueda K.,Takuma H.
Abstract
Measurements on nonlinear processes caused by multiphoton absorption and electron avalanche in optical thin films have been carried out using KrF lasers of 20-ns and 1.7-ps pulse duration. Multiphoton absorption of the order of 10-7 J was detected by a photoacoustic signal, and the nonlinear growth of photo-induced current due to the electron avalanche was analyzed dynamically. The correlation between damage threshold and carrier lifetime was investigated for oxide and fluoride coatings.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Deep UV laser induced fluorescence in fluoride thin films;Applied Physics A: Materials Science & Processing;2003-01-01
2. Deep UV laser induced luminescence in oxide thin films;Applied Physics A: Materials Science & Processing;2002-11-01