Publisher
Cambridge University Press
Cited by
5 articles.
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1. Carrier diffusion in semiconductor nanoscale resonators;Physical Review B;2024-06-03
2. Variability-Aware Modeling of Power Supply Induced Jitter;IEEE Transactions on Signal and Power Integrity;2024
3. Analytical Modeling of Time Interval Error in CMOS Inverters in presence of Supply and Ground Variations;2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference & Compatibility (APEMC/INCEMIC);2023-05-23
4. Analytical Modeling of Deterministic Jitter in CMOS Inverters;IEEE Transactions on Signal and Power Integrity;2023
5. Device Parameters Based Analytical Modeling of Ground-Bounce Induced Jitter in CMOS Inverters;IEEE Transactions on Electron Devices;2022-10