Growth of Surface Analysis and the Development of Databases and Modeling Software for Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

Growth of Surface Analysis and the Development of Databases and Modeling Software for Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Published:2016-03 Issue:2 Volume:24 Page:16-23
ISSN:1551-9295
Container-title:Microscopy Today
language:en
Short-container-title:Micros. Today

Author:

Powell C. J.

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Reference22 articles.

1. Report on the 34th IUVSTA workshop‘XPS: From Spectra to Results—Towards an Expert System’

2. NIST, “Note on the X-Ray Attenuation Databases,” http://physics.nist.gov/PhysRefData/XrayNoteB.html.

3. Surface sensitivity of X-ray photoelectron spectroscopy

4. Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy

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